新聞發布

24.04.19: SID Display Week 2019: Subpixel metrology of Micro-LED and AR/VR display applications

Visit Instrument Systems at SID Display Week, May 14-16th, 2019 in San Jose, CA / USA! At booth #1528, we will show our innovations in "Display Quality Control", "AR / VR Measurement" and "Display Production Testing". [more]

26.03.19: Comprehensive new brochure: LumiCam 2400/1300 series

The 2D imaging colorimeters of the LumiCam 2400 / 1300 series feature a precise determination of photometrical properties such as luminance and color distributions within seconds. Learn more in our new LumiCam brochure [more]

21.03.19: Lecture information: "Metrological Challenges of non-planar Displays"

The 3rd International Conference on Display Technology ICDT, due to take place in Kunshan / China from 26-28 March 2019 is organized by SID (Society for Information Display) and represents a good venue for display professionals. [more]

13.03.19: Visit us at Laser China 2019

At Laser World of Photonics China, due to take place in Shanghai from 20–22 March 2019, Instrument Systems will be exhibiting proven and brand new solutions for a wide range of current applications in the areas of LED/SSL and display measurement. [more]

07.02.19: See us at Photonics West and SIL, USA

Instrument Systems is on the road again: You can visit us at Photonics West and at Strategies in Light. Both trade fairs are due to be held in the USA in February. [more]

30.01.19: 針對UV-LED生產的快速測試

透過採用PTFE塗層的積分球和高精度光譜儀組成的測量系統,實現快速的24/7全天品質控制 [more]

17.01.19: Fast, high-resolution characterization of laser and VCSEL light sources

At Photonics West / USA Instrument Systems presents high-resolution spectroradiometers for the characterization of laser light sources and displays. [more]
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